DARPA Tech Identifies Counterfeit Microelectronics
ID: b577a3af-57d7-5b95-8b8f-e0d0105bff79
STIX ID: report--b577a3af-57d7-5b95-8b8f-e0d0105bff79
Feed Name: Security Ledger
DARPA has transferred its Advanced Scanning Optical Microscope (ASOM), developed under the IRIS program with SRI International, to NSWC Crane to support nondestructive forensic inspection of microelectronics for tampering and counterfeit components. The article frames this capability as addressing supply-chain integrity risks for DoD systems, noting the challenges of offshore chip manufacturing and referencing a separate malware discovery (Zombie Zero) as an example of hardware-related compromise concerns.
Your team is not currently subscribed to this feed. You must subscribe to it in order to see this post.